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![[Figure 2]](hat5019fig2mag.jpg)
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Figure 2
2D images of the diffraction. (a) Combined image showing the maximum intensity registered for each pixel for a measurement of area A2 before H2 exposure. The red area marks the mask used, and only the unmasked part is used in the later integration. (b) The unmasked area in (a) shown as reciprocal distance (Q) versus azimuthal angle. The area of interest is marked as the white rectangle. (c, d) The diffraction from area A2 within the white rectangle in (b) before H2 exposure (c), and after 152 min and 1200 MGy X-ray dose (d). The orange arrow marks a background line present in all measurements. The green and blue arrows mark the α line and β line, respectively. |
![[Figure 2]](hat5019fig2.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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