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Figure 7
Rietveld refinement of the X-ray powder diffraction patterns of ferberite measured on an X'Pert diffractometer using Cu Kα radiation at 300 K, before (top) and after (bottom) heating to 1123 K. The experimental data and calculated profiles are shown as red and black lines, respectively, while the blue line represents the difference curve. Vertical green ticks indicate the positions of the Bragg reflections. See details in Table 3[link].

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 4| August 2026| Pages 1238-1246
https://doi.org/10.1107/S1600576726005297
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