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Figure 3
(a) Time-resolved powder diffraction intensity map of the CPL-1 sample at 100 K using an X-ray energy of 35 keV. (b) Time dependence of the Ar gas pressure. (c) Representative diffraction patterns recorded before gas introduction (T = 0 s), shortly after Ar introduction (T = 3.9 s) and after Ar adsorption (T = 10.4 s). (d) Rietveld refinement results for the diffraction pattern recorded with a 50 ms exposure time after Ar gas adsorption. The observed and calculated profiles, the difference plot, and the Bragg positions are shown.

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APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 4| August 2026| Pages 1359-1363
https://doi.org/10.1107/S160057672600645X
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