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Figure 6
Signal recorded during incident angle scans. For the partially shadowed beam, the signal peaks at the sample's horizontal position (Mathematical equation), whereas the sum of the transmitted and reflected beam is maximal near the critical angle of the sample. A thin film of 50 nm of polystyrene on Si and Cu Kα radiation was used to simulate the reflectivity.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 4| August 2026| Pages 1247-1253
https://doi.org/10.1107/S1600576726005741
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