Convergent-beam X-ray crystallography

Li, C.; Zakharova, M.; Prasciolu, M.; Wong, J.C.; Fleckenstein, H.; Ivanov, N.; Zhang, W.; Butola, M.; Dresselhaus, J.L.; Aquino, I.D.G.; Egorov, D.; Middendorf, P.; Henkel, A.; Klopprogge, B.; Klemeyer, L.; Beck, T.; Yefanov, O.; Barthelmess, M.; Sprenger, J.; Oberthuer, D.; Bajt, S.; Chapman, H.N.

doi:10.1107/S1600576726005236

Journal of Applied Crystallography Journal of Applied
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Figure 6
3D tomo-topograph of a single bulk crystal. (a) SEM image of the Si single-crystal sample. The crystal is an approximate cubiod with dimensions 10 × 20 × 10 µm along the x, y and z axes, respectively. A letter `F' is carved into one surface of the crystal. (b), (c) Views of the crystal shape $[S({\bf x})]$ as projected along the y and x axes, respectively. (d), (e) Views of slabs of $[S({\bf x})]$ indicated by green and blue dashed boxes in (b), projected along the z axis. The `F' letter feature was etched into the surface to a depth of about 2 µm.

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ISSN: 1600-5767

Volume 59| Part 4| August 2026| Pages 1200-1218

https://doi.org/10.1107/S1600576726005236

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