Convergent-beam X-ray crystallography

Li, C.; Zakharova, M.; Prasciolu, M.; Wong, J.C.; Fleckenstein, H.; Ivanov, N.; Zhang, W.; Butola, M.; Dresselhaus, J.L.; Aquino, I.D.G.; Egorov, D.; Middendorf, P.; Henkel, A.; Klopprogge, B.; Klemeyer, L.; Beck, T.; Yefanov, O.; Barthelmess, M.; Sprenger, J.; Oberthuer, D.; Bajt, S.; Chapman, H.N.

doi:10.1107/S1600576726005236

Journal of Applied Crystallography Journal of Applied
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Figure 7
Validation of the intensity factors for CBXD. Structure-factor estimates $[|F_{hk\ell}|]$ of the single-crystal silicon `F' cuboid sample from a CBXD rotation measurement compared with calculated structure factors (blue stars). The corrections applied are D (black crosses), DL (green squares),

(yellow triangles) and

(red circles). The reflections are grouped according to the space-group symmetry $[Fd\bar{3}m]$ of the structure. The structure factors are plotted in units of electrons.

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ISSN: 1600-5767

Volume 59| Part 4| August 2026| Pages 1200-1218

https://doi.org/10.1107/S1600576726005236

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