Convergent-beam X-ray crystallography

Li, C.; Zakharova, M.; Prasciolu, M.; Wong, J.C.; Fleckenstein, H.; Ivanov, N.; Zhang, W.; Butola, M.; Dresselhaus, J.L.; Aquino, I.D.G.; Egorov, D.; Middendorf, P.; Henkel, A.; Klopprogge, B.; Klemeyer, L.; Beck, T.; Yefanov, O.; Barthelmess, M.; Sprenger, J.; Oberthuer, D.; Bajt, S.; Chapman, H.N.

doi:10.1107/S1600576726005236

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 9
Estimation of structure factors from partial topographs. (a) A full topograph for the vitamin B₁₂ crystal of Fig. 2

, formed from reflection 412. (b) A partial topograph from reflection $[4\bar{2}\bar{2}]$ . (c) The enhanced reference obtained by summing multiple full topographs of similar orientations. (d) Re-projection $[{\cal{P}}_{S}(\phi_{x},\phi_{y})]$ at the crystal orientation $[{\boldomega}]$ giving the $[4\bar{2}\bar{2}]$ reflection. The crystal boundaries (indicated by the colored dashed polygons) were determined for each full or partial topograph, and the topograph was masked in regions outside the boundary. Only the Bragg signal within the red boundary was used to estimate the structure factor by scaling each topograph to either the reference or the re-projection.

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APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 4| August 2026| Pages 1200-1218

https://doi.org/10.1107/S1600576726005236

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