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Figure 7
COM maps of the rocking curve measurements performed on (a) the BiFeO3 sample with a monochromatic box beam, (b) the BiFeO3 sample with a pink box beam, (c) the Si wafer sample with a monochromatic line beam and (d) the Si wafer sample with a pink line beam. The ROIs used for the quantification of the resolution are indicated with black rectangles.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 4| August 2026|
https://doi.org/10.1107/S1600576726005200
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