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Figure 1
Workflow for converting raw X-ray scattering intensities into absolute-scale data. The intensity notations correspond to those used in the equations presented in the subsequent sections.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 4| August 2026| Pages 1224-1237
https://doi.org/10.1107/S1600576726006187
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