Measurements and scaling of X-ray total scattering from single crystals

Gorfman, S.; Eremenko, M.; Krayzman, V.; Bosak, A.; Zavalij, P.Y.; L., I.

doi:10.1107/S1600576726006187

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 7
The reconstructed intensity $[I^{\rm s} = I_{\rm cryst}^{\rm s}(H,K,L)]$ around the 011 Bragg reflection. The top panels show HK, HL and KL projections, while the bottom panels show the H, K and L dependencies, along with the fitted background curve I₀(H, K, L).

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 4| August 2026| Pages 1224-1237

https://doi.org/10.1107/S1600576726006187

Open

access

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page