Improving polarized neutron reflectometry experiments on soft-matter samples: optimization of the solid substrate structure

Yakimenko, I.P.; Luchini, A.; Cooper, J.F.K.; Köhler, S.; Nylander, T.; Langridge, S.; Kinane, C.J.; Caruana, A.J.; Hjörvarsson, B.; Wolff, M.; Vorobiev, A.; Valyukh, S.; Eriksson, F.; Birch, J.; Järrendahl, K.

doi:10.1107/S160057672600539X

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 2
The information metric $[I = \lambda_{\min}({\bf g})]$ is the minimum eigenvalue of the FI matrix g defined in Section 2.2

, where larger values correspond to tighter Cramér–Rao lower bounds on the SLB parameters. Plots of I as a function of (a) Fe MRL thickness and (b) SiO₂ capping layer thickness; (c) the resulting SLD depth profile after optimization, and (d) the model reflectivity and simulated data for spin-up and -down. The Fe thickness decreased from the nominal value of 110.3 Å to the optimal value of 12.3 Å. The SiO₂ thickness was significantly reduced from 1131.3 Å down to the optimal value of 5.49 Å.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 4| August 2026| Pages 1192-1199

https://doi.org/10.1107/S160057672600539X

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