view article
Figure 1
Schematic of the experimental setup for fast XRR measurements. The galvo enables rapid oscillations of the incidence angle ω between incident beam and sample. The absorber plates and detector remain stationary.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 4| August 2026|
https://doi.org/10.1107/S1600576726004449
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS