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Figure 2
(a) Cropped detector image from a 213 µs sweep. Specular reflection and background ROIs are outlined. (b) Filtered positional output signal and galvanometer position versus speed. The gray line indicates sample movement during readout. (c) Calculated exposure time per pixel row of the detector. The curve for the backward motion is displayed as a broken line for visual clarity. (d) Raw counts of the measured reflection signal and averaged background (measured 0.75 mm offset from the reflection plane). The averaged background signal is indicated by a broken blue line. (e) Fully normalized fast XRR curve (points) compared with a conventional XRR scan (blue line). The cutoff positions of the stationary absorber plates are indicated as dotted red lines.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 4| August 2026|
https://doi.org/10.1107/S1600576726004449
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