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Figure 4
(a) Comparison of refnx fits of a normalized fast XRR reflectivity curve recorded within 213 µs with different data transformations. Curves are shifted by 104 relative to each other for visual clarity. The range of solutions generated from MCMC samples are displayed as colored shading. (b) Distribution of fitted parameters from 100 individual scans with 213 µs exposure time. Fits were performed using identical fitting parameter boundaries in each case with the differential evolution optimizer without MCMC sampling. The reference value from fitting a conventional XRR curve is displayed as the dashed red line.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 59| Part 4| August 2026|
https://doi.org/10.1107/S1600576726004449
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