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Figure 2
(a) Experimental layout at the TPS 09A beamline. An overall energy resolution of 2.8 × 10−8 was achieved using a four-crystal high-resolution monochromator comprising two pairs of highly asymmetrically cut Si crystals. (b) Definition of the crystal geometry showing the surface orientation, the diffracting planes, the incident beam and the surface miscut angle used for grazing-incidence X-ray back-diffraction. (c) Experimental arrangement used to determine the angular dispersion rate. A knife edge was scanned through the back-diffracted beam to determine its angular position.

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CRYSTALLOGRAPHY
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