Experimental observation of grazing-incidence X-ray back-diffraction with large angular dispersion

Chen, S.-L.; Soo, Y.-L.; Lin, B.-H.; Chuang, T.-H.; Weng, S.-C.; Tsai, Y.-W.; Tang, M.-T.

doi:10.1107/S1600576726009246

Figure 5
Comparison of ADRs predicted by the conventional DuMond analysis, the kinematic prediction and the full dynamical calculations as functions of the surface miscut angle. The experimental ADR measured in the present work is also shown. Unlike the DuMond analysis, both the kinematic and dynamical treatments predict finite ADR values as the miscut angle approaches 90°. The calculated intrinsic reflectivity of the Si (12 4 0) back-diffraction reflection is shown on the right-hand axis. It corresponds to an ideal Si crystal under the plane-wave approximation and does not include experimental resolution effects.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 6| December 2026|

https://doi.org/10.1107/S1600576726009246

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