forthcoming articles

Two recently reported quantitative phase analysis (QPA) methods—the direct derivation method (DDM) and the unit-cell scattering power method—have been further developed into the C_k-corrected DDM and the molecular scattering power method, respectively. These methods are compatible with the conventional Rietveld QPA routine, as demonstrated through quantification of disordered clay mineral phases using the TOPAS software.

An analytical model is presented that successfully describes how out-of-phase boundaries in epitaxial thin films of layered materials affect X-ray diffraction (XRD) peak profiles. It is applied to describing the experimental XRD profiles of two types of Aurivillius oxide thin films: SrBi₂(Ta,Nb)O₉ and Bi₄Ti₃O₁₂.

The first combined analysis is presented of X-ray dark-field signals and small-angle X-ray scattering curves from several samples producing different sources of scattering.

Pydidas is a new Python package for processing X-ray diffraction data, offering a user-friendly interface and versatile processing options. It includes a graphical user interface for the entire data processing pipeline and is intended to be easily accessible for non-experts.

A statistical model for complex oxide superlattices is introduced. The model can be applied in kinematical calculations of X-ray diffraction intensities for epitaxially grown samples.

The mechanical behavior of piezoelectric ZnO nanowires was studied, demonstrating a fracture strength of up to 3 GPa, significantly higher than bulk ZnO. This enhanced strength increases energy-harvesting potential and reveals unexpected plasticity with dislocation storage in the basal plane.

A comparison is reported of the modulation of intensity with zero effort (MIEZE), a neutron spin–echo (NSE) technique, and neutron time-of-flight (ToF) spectroscopy, a conventional neutron scattering method. The basis of this comparison is provided by measurements performed on pure water under the same measurement conditions.