view article
Figure 1
General schematics of (a) a TEM and (b) a STEM instrument. (a) A plane wave illuminates the object, after which an image is formed using a set of electromagnetic lenses. (b) An electron beam with convergence angle α is scattered by the specimen and collected by an annular detector with inner and outer angles β1 and β2, respectively.

IUCrJ
Volume 3| Part 1| January 2016| Pages 71-83
ISSN: 2052-2525
doi:10.1107/S2052252515019727