Advanced electron crystallography through model-based imaging

Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G.

doi:10.1107/S2052252515019727

Figure 5
(a) Experimental HAADF STEM image of nanosized Ag clusters embedded in an Al matrix in $[[ 1 0 {\overline 1}]]$ zone-axis orientation. (b) Refined parameterized model of the boxed region of part (a). (c) The number of Ag atoms per column. (d) Histogram of scattering cross-sections of the Ag columns. (e) Integrated classification likelihood (ICL) criterion evaluated as a function of the number of Gaussians in a mixture model. (f) Experimental HAADF STEM image in [100] zone-axis orientation. (g) Refined model of the boxed region of part (f). (h) The number of Ag atoms per column. (i) A computed three-dimensional reconstruction of the Ag nanocluster, viewed along three different directions. Reproduced from Van Aert et al. (2011