Advanced electron crystallography through model-based imaging

Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G.

doi:10.1107/S2052252515019727

Figure 6
(a) Experimental HAADF STEM image of an Au nanorod. (b) Refined parameterized model. (c) The number of Au atoms per column. (d) ICL criterion evaluated as a function of the number of Gaussians in a mixture model. (e) Histogram of scattering cross-sections of the Au columns, together with the estimated mixture model and its individual components. (f) Comparison of experimental and simulated scattering cross-sections. Adapted with permission from Van Aert et al. (2013