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Figure 9
Accumulated Bragg spots of 3000 patterns collected from hAQP2 crystals with the silicon chip oriented perpendicular to the beam (a) and at a tilt angle of 25° (b). The preferred orientation of the crystals lying on the silicon-chip surface leads to poor coverage of reciprocal space. In order to obtain a more complete data set, the chip has to be tilted during data collection. The color code of the scale bars indicates the number of patterns that contribute to each pixel in merged reciprocal space.

Volume 6| Part 4| July 2019| Pages 714-728
ISSN: 2052-2525