view article
Figure 1
(a) Overall layout of optical components of the X-ray magnetic diffraction in the horizontal diffraction geometry; two additional degrees of rotational freedom in the vertical plane are not specified. Note that the extra degree of rotational freedom (ϕ) of the sample controls its azimuthal angle φ. (b) Two choices of diffraction geometry. The linearly polarized X-rays from the synchrotron provide either a π (in-plane for horizontal diffraction) or a σ (out-of-plane for vertical diffraction) initial condition. (c) Aerial view of the horizontal diffraction experimental setup in the experimental hutch of Sector 4-ID-D of the APS. (d) Measured mosaic profile (∼0.35° FWHM) of a 5 mm thick, highly oriented pyrolytic graphite (HOPG) polarization analyzer for X-rays at the Os L2 resonance edge (12.387 keV).

IUCrJ
Volume 6| Part 4| July 2019| Pages 507-520
ISSN: 2052-2525
https://doi.org/10.1107/S2052252519007061