DeepRes: a new deep-learning- and aspect-based local resolution method for electron-microscopy maps

Ramírez-Aportela, E.; Mota, J.; Conesa, P.; Carazo, J.M.; Sorzano, C.O.S.

doi:10.1107/S2052252519011692

Figure 5
Oversharpening detection. Comparison of BlocRes applied to the unsharpened map (top of the figure) and DeepRes applied to each B-factor sharpened map. The correlation (CC) of each sharpened map and the generated map from the deposited atomic model (PDB entry 6bdf) was calculated using PHENIX. The red line corresponds to the 20% percentile of the local resolution distribution of BlocRes.

IUCrJ

Volume 6| Part 6| November 2019| Pages 1054-1063

ISSN: 2052-2525

https://doi.org/10.1107/S2052252519011692

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