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Figure 1
Examples of diffraction patterns from the SPI experiment. (a), (b) Diffraction patterns corresponding to a single PR772 virus hit by an XFEL beam. (c) A diffraction pattern corresponding to a non-single hit which was sorted out from the analysis at the classification step. (d) A sum of 1.9 × 105 diffraction patterns identified as hits. White regions in the center of the diffraction patterns as well as white stripes correspond to a mask introduced to reduce artefacts owing to the signal exceeding the detector capabilities. The mask was the same before and after the move of the detector panel. (e) The PSD function of the scattered intensity for the sum of all diffraction patterns identified as hits collected in the experiment. The signal until the corner and edge of the detector is indicated by the green and black vertical dashed lines, respectively. For orientation determination the data until momentum-transfer values of 1 nm−1 (shown by the red dashed line) were used.

IUCrJ
Volume 7| Part 6| November 2020| Pages 1102-1113
ISSN: 2052-2525
https://doi.org/10.1107/S2052252520012798