Analytic modeling of inhomogeneous-resolution maps in cryo-electron microscopy and crystallography

Urzhumtsev, A.; Lunin, V.Y.

doi:10.1107/S2052252522008260

Figure 2
Atomic images and Fourier ripples. (a) Electron-density distributions for an immobile carbon atom and its images affected by disorder and resolution cutoff. (b) Corresponding scattering functions [Fourier transform of the functions shown in (a)]. (c) Radial part of the interference function G(x) and (d) this function in the two-dimensional section z = 0. Approximation to (e) the first negative and (f) the first positive ripples of G(x) by the weighted functions Ω(x; μ, ν) according to Table 1