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Figure 1
(a) Low-magnification image of ribbons of 100 nm CEMOVIS sections. Each ribbon contains several sections that are carefully drawn from the block of frozen sample by the advancing knife. Both ribbons come from the same sample. (b) Medium-low magnification view of a grid square covered by a CEMOVIS ribbon. (c) Medium magnification view of carbon film holes covered by a CEMOVIS ribbon. (d) High-magnification micrograph of yeast cells within a CEMOVIS ribbon. (e) 2D power spectrum of a micrograph shown in (d), overlaid with the equiphasic average (lower right quadrant) and fitted contrast transfer function (CTF) model (lower left quadrant). (f) Plot of the equiphasic average (EPA) of the power spectrum of the micrograph shown in (d), together with the fitted CTF model and `goodness-of-fit' indicator. The fitted parameters show an average defocus of 760 nm and a sample thickness of 174 nm. Thon rings could be fitted up to a resolution of 3.1 Å.

IUCrJ
Volume 12| Part 4| July 2025| Pages 502-510
ISSN: 2052-2525
https://doi.org/10.1107/S2052252525005196