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Figure 4
(a), (b) 60S detections within a representative micrograph from a FIB-milled sample (a) and CEMOVIS sample (b), projected along the y axis. Points are colored according to the refined SNR scores. Lower scores are found at the top and bottom surface of the FIB-milled sample (Lucas & Grigorieff, 2023BB22). No such pattern is apparent in the CEMOVIS sample. (c), (f) Location of 60S detections in two representative micrographs plotted on top of micrographs, which were band-pass filtered to accentuate the crevasses. Points are colored according to the refined SNR scores. A green line indicates ΨCrevasses and a red line indicates ΨClustering. Additionally, the dimensions of the ellipse used for anisotropic Ripley's analysis are indicated as a red ellipse, 600 Å along the long axis and 200 Å along the short axis (drawn to scale). (d), (g) Plots of the intensity variance score used to determine ΨCrevasses (green) and the elliptical Ripley's K score used to determine ΨClustering. (e), (h) Comparison of the distribution of pixel intensities of the band-passed filtered micrographs shown in (c) and (f) with the pixel intensities at 60S detections. Panels (c), (d) and (e), and panels (f), (g) and (h) refer to one micrograph, respectively. (i) Histogram of the difference between ΨCrevasses and ΨClustering in the 100 CEMOVIS micrographs with the largest number of detections.

IUCrJ
Volume 12| Part 4| July 2025| Pages 502-510
ISSN: 2052-2525
https://doi.org/10.1107/S2052252525005196