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Figure 3
Results from dynamical structure refinement of the muscovite high-energy electron diffraction data. (a) Dependence of the Rall value from dynamical structure refinements as function of the adopted sample thickness. (b) Decay of the mean I/σ(I) ratio in the diffraction data as function of the increasing effective sample thickness caused by sample rotation and the corresponding goniometer angle. (c) View of the muscovite layer structure along the crystallographic a axis. (d) Detailed view of the muscovite structure with anisotropic thermal displacement parameters indicated as ellipsoids (potassium = violet, aluminium = blue, oxygen = red, hydrogen = pink). (e) Overlay of the OH group with anisotropic thermal displacement parameters shown as ellipsoids obtained with electron diffraction (ED, this work) and a reference model obtained with neutron diffraction (ND) (Gatta et al., 2011 |
ISSN: 2052-2525
ELECTRON CRYSTALLOGRAPHY
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