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Figure 2
Collected intensity on single frames corresponding to strong reflections against user-defined box sizes integrated by means of the (a) sum counts and (b) fit profile method. (c) Frame-by-frame tilt correction plots of the alpha angle for LATP-3 measured with a Jeol analytical tomography holder and (d) ALM-2 measured with a Hitachi HT7800 single tilt holder. Data points in red correspond to angular corrections for tilt angles directly retrieved during acquisition, while data points in blue correspond to those calculated according to an initial tilt angle, tilt velocity and experiment time. The angle movement was smoothed out using a moving average of six frames (1.5°/3°). (e) Merged error Rint for different crystals measured either by precession or continuous-rotation ED. (f) Merged error Rint for different tilt increments in the stepwise static tilt experiment.

IUCrJ
Volume 13| Part 3| May 2026| Pages 291-303
ISSN: 2052-2525
https://doi.org/10.1107/S2052252526003155