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Figure 4
Grain boundary overlay and their positional error. (a) Overlay of the grain boundaries extracted from raster scanning data (black) and DLX data (red) in the xs–ys plane show high similarity. (b) The histogram of pairwise distances between grain boundaries ob­tained from the raster and DLX maps shows that the deviation is smaller than 25 µm.

IUCrJ
Volume 13| Part 4| July 2026|
ISSN: 2052-2525
https://doi.org/10.1107/S2052252526004033