A picture is worth a thousand diffraction spots: using photometry and computer vision to perform rapid high-throughput sample-versatile serial crystallography

Coulson, B.A.; Lewis, S.G.; Orr, C.; Hatcher, L.E.; Allan, D.R.; Warren, M.

doi:10.1107/S2052252526003568

Figure 2
An overview of how the steps were taken, showing how the photometric selection (PS) method compared to the diffractive sweep (DS) method in finding crystals on a flat planar substrate.

IUCrJ

Volume 13| Part 4| July 2026| Pages 409-419

ISSN: 2052-2525

https://doi.org/10.1107/S2052252526003568

NEUTRON | SYNCHROTRON

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