view article
Figure 1
Development of liquid-helium-cooled cryo-electron microscopes. We have traced the development history of cryo-electron microscopes equipped with liquid-helium-cooled specimen stages and transfer systems, spanning from early test apparatus to the seventh generation. In 2020, we developed the eighth-generation cryo-electron microscope system (JEM-Z320FHC) at 300 kV for single-particle analysis, newly equipped with a cold field emission gun (FEG) and an in-column energy filter. The eighth-generation microscope also has a liquid helium stage, but data acquisition for single-particle analysis was performed at liquid nitro­gen temperature.

IUCrJ
Volume 13| Part 4| July 2026|
ISSN: 2052-2525
https://doi.org/10.1107/S2052252526003234