Lighting up materials with X-rays: advanced X-ray excited optical luminescence probe at the BM08-XAFS/XRF beamline, SESAME

Khan, L.U.; Hasoneh, A.R.; Ahmad, A.; Dokuyucu, C.; Mohammad, A.; Aldrabee, A.; Iqbal, M.; Al Omari, F.; Al Natsheh, A.; Rehman, A.U.; Shehab, M.; AlZubi, M.; Mohammad, H.; Khan, Z.U.; Canisares, F.S.M.; Harfouche, M.; Figueroa, S.J.A.; Hameed, F.; Lausi, A.; Brito, H.F.

doi:10.1107/S2052252526007815

Figure 5
(a)–(d) XEOL spectra of the PMMA–(2–5%)Et₄N[Eu(nta)₄] hybrid films, measured under excitation at 7100, 7800 and 8200 eV monochromatic X-ray energies, above the Eu L_3,2,1 edges.

IUCrJ

Volume 13| Part 6| November 2026|

ISSN: 2052-2525

https://doi.org/10.1107/S2052252526007815

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