Lattice-parameter measurement technique for single crystals using two lattice planes, and its application to Gd₃Ga₅O₁₂ single crystals

A lattice-parameter measurement technique using two lattice planes and monochromatic X-ray beams has been investigated. Accuracy, measurement correction and extensions of the technique are discussed. With this technique, the lattice parameters of Gd₃Ga₅O₁₂, single crystals, grown under different conditions, have been measured to an accuracy of ±0.0003 Å. From the results obtained for Gd₃Ga₅O₁₂, single crystals, it has been found that the technique has several advantages in comparison with conventional methods.