Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 9| Part 4

ISSN: 1600-5767

August 1976 issue

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research papers

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Mise en évidence par diffraction électronique de la mise en ordre des atomes de nickel en excès par rapport à la stoechiométrie dans les alliages β'-NiAl riches en nickel: formation d'une surstructure Ni₂Al

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Characteristics of a channel plate as an image intensifier for X-ray topography

M. Ando, S. Hosoya and K. Namikawa

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Wavelength-dependent reflectivities of a few neutron monochromators

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Etude des fautes d'empilement dans les kaolinites partiellement désordonnées. II. Modèles d'empilement comportant des fautes par rotation

A. Plançon and C. Tchoubar

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The detection of small differences in lattice constant at low temperature by an energy-dispersive X-ray diffractometer

T. Nakajima, T. Fukamachi, O. Terasaki and S. Hosoya

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Indexing crystal faces on SEM photographs

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The neutron small-angle camera D11 at the high-flux reactor, Grenoble

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The influence of elastic anisotropy on the X-ray topographic image width of pure screw dislocations

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Etude du polytypisme des cristaux de carbure de silicium par diffraction électronique par réflexion

P. Michel, J. P. Gauthier and R. Riwan

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The investigation of multi-reflection images from small crystallites using dark-field electron microscopy

W. Krakow and B. M. Siegel

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Phase transition studies of pure and flux-grown barium titanate crystals

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A rapid procedure for aligning crystals on the precession camera

D. R. Stirling and F. J. de Wet

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Lattice-parameter measurement technique for single crystals using two lattice planes, and its application to Gd₃Ga₅O₁₂ single crystals

S. Isomae, S. Kishino, K. Takagi, M. Ishii and M. Maki

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Méthode d'indexation rapide des diagrammes de diffraction électronique en réflexion de la face (00.1) de cristaux hexagonaux

J. Bessières, J. J. Heizmann and R. Baro

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short communications

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An erratum: effective particle size as determined by the initial slope of the Fourier-coefficient-against-order curve for X-ray diffraction line profiles

G. B. Mitra and B. K. Mathur

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Epaisseur moyenne de domaines ordonnés de LiFe₅O₈ dans diverses directions

M. Bessière, F. Bley, Y. Calvayrac, S. Lefebvre and M. Fayard

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Problems in the simulation of dark-field images in X-ray topography and electron microscopy

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Transmission absorption-edge technique for absolute polarity determination

S. C. Abrahams and J. L. Bernstein

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crystal data

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Crystal data for two new lanthanide acid iodates: Pr(IO₃)₃.HIO₃ and 3La(IO₃)₃.JIO₃.7H₂O

S. C. Abrahams, J. L. Bernstein, J. W. Shiever and K. Nassau

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Crystal data for tris (trimethylammonium) heptabromodicadmate

A. Daoud and J. C. Mutin

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Crystal data for some o-molecular compounds

F. H. Herbstein, M. Kaftory and H. Regev

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Constantes cristallographiques de CuSe₂O₅, CuSeO₃ et Cu₂SeO₄

G. Meunier and M. Bertaud

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Crystal data for a tetrahydrated compound of 1,2-ethanedisuplhonic acid with Cu^II: Cu[SO₃(CH₂)₂SO₃].4H₂O

F. Charbonnier, J. Faure and H. Loiseleur

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Données cristallographiques sur deux phosphates de scandium: Sc(PO₃)₃ et Sc₄(P₄O₁₂)₃

M. Bagieu-Beucher

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laboratory notes

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Alimentation autonome en azote liquide: application à un dispositif basse température Stoe

S. Lecocq and A. Thozet

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Observation of lead Lα radiation from commercial X-ray tubes

G. J. McIntyre and Z. Barnea

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crystallographers

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Crystallographers

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international union of crystallography

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Report of the Tenth General Assembly and International Congress of Crystallography

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World Directory of Crystallographers. Fifth Edition

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book reviews

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Real solids and radiation by A. E. Hughes and D. Pooley

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Fraktionierung der Spurenelemente bei der Kristallisation by H. E. Usdowski

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Surface physics by M. Prutton

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