The application of asymmetric Bragg reflections in the Bond method of measuring lattice parameters

Asymmetric Bragg reflections have been applied in precise lattice-parameter determinations of thin, near-surface single-crystal layers. The measurements were performed by the Bond method which combines considerable simplicity and high accuracy. The reflection asymmetry greatly reduces the penetration depth of X-rays but requires a careful application of proper corrections. An example is described of the measurement of lattice-parameter changes in the near-surface layer of a silicon crystal doped with boron.