Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 13
|
Part 1
ISSN: 1600-5767
February 1980 issue
research papers
J. Appl. Cryst.
(1980).
13
,
1-6
,
https://doi.org/10.1107/S0021889880011417
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On the geometrical conditions for recording X-ray topographs of large crystal slices
A. Lindegaard-Andersen
,
C. Christiansen
and
L. Zsoldos
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J. Appl. Cryst.
(1980).
13
,
7-11
,
https://doi.org/10.1107/S0021889880011429
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Determination of particle-size distribution functions from small-angle scattering data by means of the indirect transformation method
O. Glatter
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J. Appl. Cryst.
(1980).
13
,
12-16
,
https://doi.org/10.1107/S0021889880011430
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The application of asymmetric Bragg reflections in the Bond method of measuring lattice parameters
M. Wołcyrz
,
A. Pietraszko
and
K. Łukaszewicz
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J. Appl. Cryst.
(1980).
13
,
17-23
,
https://doi.org/10.1107/S0021889880011442
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The formation of varieties of carbon ordering in pseudobinary compounds of V
2
C, Nb
2
C and Ta
2
C
K. Hiraga
and
M. Hirabayashi
Read article
J. Appl. Cryst.
(1980).
13
,
24-30
,
https://doi.org/10.1107/S0021889880011454
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Phases, lattice parameters and thermal expansion of (Ga
x
In
1−
x
)
2
Se
3
, 1≥
x
≥0, between room temperature and melting point
A. Tonejc
,
S. Popović
and
B. Gržeta-Plenković
Read article
J. Appl. Cryst.
(1980).
13
,
31-33
,
https://doi.org/10.1107/S0021889880011466
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X-ray Bragg reflexion and strain compensation in silicon crystals
A. Fukuhara
,
Y. Takano
,
M. Namba
and
M. Maki
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J. Appl. Cryst.
(1980).
13
,
34-45
,
https://doi.org/10.1107/S0021889880011478
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The determination of diffuse-boundary thicknesses of polymers by small-angle X-ray scattering
J. T. Koberstein
,
B. Morra
and
R. S. Stein
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J. Appl. Cryst.
(1980).
13
,
46-49
,
https://doi.org/10.1107/S002188988001148X
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A miniature piston-cylinder apparatus for high-pressure X-ray diffraction in conjunction with energy dispersion
W. Nuding
,
E. Hinze
and
G. Will
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J. Appl. Cryst.
(1980).
13
,
50-57
,
https://doi.org/10.1107/S0021889880011491
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Etude des défauts des croissance dans des monocristaux naturels de quartz
A. Ser
,
J. P. Bideau
,
J. Clastre
and
A. Zarka
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J. Appl. Cryst.
(1980).
13
,
58-64
,
https://doi.org/10.1107/S0021889880011508
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Theoretical considerations of extra equal-thickness fringes around a dislocation outcrop observed with an X-ray plane wave
H. Ishida
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J. Appl. Cryst.
(1980).
13
,
65-73
,
https://doi.org/10.1107/S002188988001151X
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Analysis of stacking order and disorder by continuous Fourier transformation of diffracted intensities. Example: β'
1
Cu–Al martensite
G. Van der Perre
and
A. Deruyttere
Read article
J. Appl. Cryst.
(1980).
13
,
74-77
,
https://doi.org/10.1107/S0021889880011521
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Notes on the handling of position and broadening errors in deconvoluted X-ray diffraction line profiles
Th. H. de Keijser
and
E. J. Mittemeijer
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J. Appl. Cryst.
(1980).
13
,
78-87
,
https://doi.org/10.1107/S0021889880011533
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Assessment of synchrotron electron-beam damage in diamond by optical, cathodoluminescence and X-ray topographic methods
Mai Zhen-Hong
and
A. R. Lang
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J. Appl. Cryst.
(1980).
13
,
88-92
,
https://doi.org/10.1107/S0021889880011545
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Appareil de microdéformation à chaud pour topographie aux rayons X. Application à des bicristaux de germanium
P. Debrenne
,
A. Mathiot
and
R. de Tournemine
Read article
crystal data
J. Appl. Cryst.
(1980).
13
,
93-95
,
https://doi.org/10.1107/S0021889880011557
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Crystal data for two kinds of molecular alloys between sebacic and dodecanedioic acids
Y. Haget
,
M. A. Cuevas
,
N. B. Chanh
,
L. Bonpunt
and
M. Font Altaba
Read article
J. Appl. Cryst.
(1980).
13
,
95-96
,
https://doi.org/10.1107/S0021889880011569
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Crystal data for hexamethylenetetraselenafulvalene-perfluorotetracyanoquinodimethane
T. J. Emge
,
T. J. Kistenmacher
,
W. Bryden
and
L. K. Frevel
Read article
J. Appl. Cryst.
(1980).
13
,
96-97
,
https://doi.org/10.1107/S0021889880011570
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Données crystallographiques sur les formes α et β du dichromate de baryum BaCr
2
O
7
D. Blum
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J. Appl. Cryst.
(1980).
13
,
98-99
,
https://doi.org/10.1107/S0021889880011582
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Données cristallographiques de l'octohydrate du métagallate(III) de lithium
C. Caranoni
and
L. Capella
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J. Appl. Cryst.
(1980).
13
,
99-100
,
https://doi.org/10.1107/S0021889880011594
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Kristallstrukturdaten von Mn
2
Ge
M. Ellner
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computer programs
J. Appl. Cryst.
(1980).
13
,
100-101
,
https://doi.org/10.1107/S0021889880011600
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A program to generate Bragg reflections compatible with lattice type and systematic absences
E. Arzi
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J. Appl. Cryst.
(1980).
13
,
101-104
,
https://doi.org/10.1107/S0021889880011612
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LSD
: a Fortran software for mini-computers to control a four-circle neutron diffractometer for single crystals
A. Barthélemy
and
A. Filhol
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laboratory notes
J. Appl. Cryst.
(1980).
13
,
105
,
https://doi.org/10.1107/S0021889880011624
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A computer-controlled slit unit for the PW1100 diffractometer
S. Harkema
and
G. J. van Hummel
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international union of crystallography
J. Appl. Cryst.
(1980).
13
,
105
,
https://doi.org/10.1107/S0021889880011636
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Twelfth General Assembly and International Congress of Crystallography
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J. Appl. Cryst.
(1980).
13
,
106
,
https://doi.org/10.1107/S0021889880011648
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Donation
Read article
crystallographers
J. Appl. Cryst.
(1980).
13
,
106
,
https://doi.org/10.1107/S002188988001165X
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Crystallographers
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book reviews
J. Appl. Cryst.
(1980).
13
,
106
,
https://doi.org/10.1107/S0021889880011661
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Crystal growth: theory and techniques. Vol. 2
edited by C. H. L. Goodman
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J. Appl. Cryst.
(1980).
13
,
107
,
https://doi.org/10.1107/S0021889880011673
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Optical determination of rock forming minerals
by Tröger Tröger
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J. Appl. Cryst.
(1980).
13
,
107
,
https://doi.org/10.1107/S0021889880011685
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Current topics in materials sceince. Vol. 1
edited by E. Kaldis
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J. Appl. Cryst.
(1980).
13
,
107-108
,
https://doi.org/10.1107/S0021889880011697
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Diffraction and imaging techniques in material science
edited by S. Amelinckx, R. Gevers and J. Van Landuyt
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books received
J. Appl. Cryst.
(1980).
13
,
108
,
https://doi.org/10.1107/S0021889880011703
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CALPHAD: Computer Coupling of Phase Diagrams
edited by L. Kaufman
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