Single-crystal time-of-flight neutron diffraction of Cr₃Si and MnF₂ comparison with monochromatic-beam techniques

Single-crystal time-of-flight (TOF) neutron diffraction data have been collected for Cr₃Si and MnF₂ with the Argonne Intense Pulsed Neutron Source. The purpose of this study was to test the accuracy of the TOF technique by a comparison with results from recent γ-ray, X-ray and neutron diffraction experiments. The results show that for simple crystal structures the positional and thermal parameters obtained from TOF data approach those obtained by other diffraction methods.