Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 20| Part 2

ISSN: 1600-5767

April 1987 issue

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research papers

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Scattering from fractals

J. E. Martin and A. J. Hurd

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Rietveld refinement of Debye–Scherrer synchrotron X-ray data from Al₂O₃

P. Thompson, D. E. Cox and J. B. Hastings

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Measurement of intensity of directionally diffuse streaks on a four-circle diffractometer: divergence correction factors for bisecting setting

D. Pandey, L. Prasad, S. Lele and J. P. Gauthier

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Optics of curved-crystal neutron spectrometers. I. Three-axis spectrometers

M. Popovici, A. D. Stoica and I. Ioniţã

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Crystal chemistry and thermoelectric properties of Gd₂Te₃

J. S. Swinnea, H. Steinfink and L. R. Danielson

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Three-isotopic-substitutions method in small-angle neutron scattering

M. Y. Pavlov and I. N. Serdyuk

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Imperfections in (Ga_1−xAl_xAs)n₁–(GaAs)n₂/GaAs supperlattices as observed by X-ray diffraction techniques

J. F. Petroff, M. Sauvage-Simkin, S. Bensoussan, B. Capelle, P. Auvray and M. Baudet

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Single-crystal time-of-flight neutron diffraction of Cr₃Si and MnF₂ comparison with monochromatic-beam techniques

W. Jauch, A. J. Schultz and G. Heger

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Determination of the neutron absorption cross section for hydrogen as a function of wavelength with a pulsed neutron source

J. A. K. Howard, O. Johnson, A. J. Schultz and A. M. Stringer

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Structure determination by use of pattern decomposition and the Rietveld method on synchrotron X-ray and neutron powder data; the structures of Al₂Y₄O₉ and I₂O₄

M. S. Lehmann, A. N. Christensen, H. Fjellvåg, R. Feidenhans'l and M. Nielsen

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short communications

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Greatly reduced radiation damage in ribonuclease crystals mounted on glass fibers

J. C. Dewan and R. F. Tilton

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crystal data

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Caractérisation du dihydro-9,10 anthracène par analyse X sur poudres

C. Caranoni and J. P. Reboul

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Crystal data for 14 fluorides LnMoF₇ (Ln=lanthanide)

J. Angenault, J. C. Couturier, Y. Mary and M. Quarton

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computer programs

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UNISOFT – a program package for lattice-dynamical calculations

G. Eckold, M. Stein-Arsic and H. J. Weber

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STRUCTURE TIDY – a computer program to standardize crystal structure data

L. M. Gelato and E. Parthé

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laboratory notes

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X-ray diffraction using combined film and microprocessor techniques

E. J. Samuelsen

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crystallographers

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Crystallographers

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new commercial products

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New Commercial Products

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book reviews

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Kristallstruktur und chemische Bindung by A. Weiss and H. Witte

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