X-ray diffraction profiles of defective layered lattices showing preferred orientation

In layered lattices the layers tend to stratify and the stratified layer domains often exhibit preferred orientation in bulk samples. Using the Laplace and Hankel transform techniques, equations have been developed for the profiles of the two-dimensional (hk) reflections from defective layered lattices in different orientation modes. Two different approaches have been used in the derivation, the inter-atomic distance sum method and the lattice sum method, and the results have been compared.