Optimization of scan procedure for single-crystal X-ray diffraction intensities

Killean, R.C.G.

doi:10.1107/S0567739473000537

Optimization of scan procedure for single-crystal X-ray diffraction intensities

An equation is developed for the times to be spent on the ordinates of a scan of a reflexion in order to obtain the minimum counting-statistics error in the integrated intensity for a given total scan time.

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Format		BIBTeX
		EndNote
		RefMan
		Refer
		Medline
		CIF
		SGML
		Text
		Plain Text

Format		BIBTeX
		EndNote
		RefMan
		Refer
		Medline
		CIF
		SGML
		Text
		Plain Text

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Optimization of scan procedure for single-crystal X-ray diffraction intensities

Subscribe to Acta Crystallographica Section A: Foundations and Advances

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