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Disposition of a monochromator crystal relative to the specimen crystal on a diffractometer, such that the respective diffraction planes are at 45°, makes knowledge of the actual value of the polarization ratio for the monochromator crystal unnecessary for the conversion of measured intensities to structure-factor values for the specimen crystal. This arrangement, therefore, avoids the uncertainty often associated with poor knowledge of the polarization ratio of monochromator crystals, and so can contribute to improved accuracy of measured structure factors.

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