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A comparison of the two methods available for the calculation of exact values of pseudorotation parameters P, τm, i.e. the Fourier-series (FS) method [Rao, Westhof & Sundaralingam (1981). Acta Cryst. A37, 421-425] and the least-squares (LS) method [Jaskólski (1983). J. Chem. Educ. 60, 980-981] reveals that they yield identical values for τm and P. The variances σ2(τm) and σ2(P) calculated by these methods are, however, different since they have different interpretations.
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