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The FAULTS program is a powerful tool for the refinement of diffraction patterns of materials with planar defects. A new release of the FAULTS program is herein presented, together with a number of new capabilities, aimed at improving the refinement process and evolving towards a more user-friendly approach. These include the possibility to refine multiple sets of single-crystal profiles of diffuse streaks, the visualization of the model structures, the possibility to add the diffracted intensities from secondary phases as background and the new DIFFaX2FAULTS converter, among others. Three examples related to battery materials are shown to illustrate the capabilities of the program.

Supporting information

pdf

Portable Document Format (PDF) file https://doi.org/10.1107/S1600576716014473/kc5049sup1.pdf
Details of the structural models used in Li[epsilon]Ni1.02O2 and MnO2 examples

txt

Text file https://doi.org/10.1107/S1600576716014473/kc5049sup2.txt
FAULTS input file for LixNi1.02O2 example

txt

Text file https://doi.org/10.1107/S1600576716014473/kc5049sup3.txt
FAULTS input file for Li2PtO3 example

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Text file https://doi.org/10.1107/S1600576716014473/kc5049sup4.txt
FAULTS input file for MnO2 example


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