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Structural analysis of anion-rich C-type Gd
2O
3 was carried by the Rietveld refinement of the powder X-ray diffraction data for compositions Gd
0.8Ce
0.2O
1.60 and Gd
0.6Ce
0.4O
1.70. Both compounds have a body-centred cubic lattice (space group
Ia, No. 206,
Z = 32) with unit-cell parameters of 10.8488 (1) and 10.8542 (1) Å, respectively. Both of these compounds are iso-structural with the C-type rare earth oxides, with excess anions as required for charge balance. The structural analysis reveals that there are two different kinds of metal ion site, namely 8
b (
M1) and 24
d (
M2), and two different kinds of anion sites, namely 48
e (O1) and 16
c (O2). The excess anions occupy the 16
c (
xxx) sites. The two metal ions each form an approximately eightfold-coordination polyhedron with O1 and O2. The details of these two compositions are explained and compared with both the CeO
2 structure and the Gd
2O
3 structure,
i.e. the end member.
Supporting information
For both compounds, program(s) used to refine structure: FULLPROF.
(I) Gadolinium Cerium oxide
top
Crystal data top
Gd0.6Ce0.4O1.70 | Dx = 7.38 Mg m−3 |
Mr = 177.60 | X-ray radiation, λ = ? Å |
Cubic, IA3 | T = 293 K |
Hall symbol: -I 2b 2c 3 | White |
a = 10.8542 (1) Å | flat sheet, ? × ? × ? mm |
V = 1278.76 (1) Å3 | Specimen preparation: Prepared at 1673K K, cooled at 2K/min K min−1 |
Z = 32 | |
Data collection top
Philips PW1710 diffractometer | Data collection mode: reflection |
Radiation source: sealed X-ray tube | Scan method: Step |
Graphite 002 face monochromator | 2θmin = 10.000°, 2θmax = 110.000°, 2θstep = 0.020° |
Specimen mounting: Sample pasted with on glass slide with collodion binder | |
Refinement top
Rp = 8.30 | Profile function: 'Pseudo-voigt function'
'U = 0.01502(471) V = -0.00722(529) W = 0.01885(145)'
'Eta = 0.633(35), X = 0.0069(8)' |
Rwp = 11.4 | 1 parameters |
Rexp = 9.25 | 0 restraints |
RBragg = 4.79 | |
χ2 = NOT FOUND | Background function: 5th order polynomial function |
5001 data points | Preferred orientation correction: 'March function' axis (001), G1 = 0.9608(57), |
Crystal data top
Gd0.6Ce0.4O1.70 | Z = 32 |
Mr = 177.60 | X-ray radiation, λ = ? Å |
Cubic, IA3 | T = 293 K |
a = 10.8542 (1) Å | flat sheet, ? × ? × ? mm |
V = 1278.76 (1) Å3 | |
Data collection top
Philips PW1710 diffractometer | Scan method: Step |
Specimen mounting: Sample pasted with on glass slide with collodion binder | 2θmin = 10.000°, 2θmax = 110.000°, 2θstep = 0.020° |
Data collection mode: reflection | |
Refinement top
Rp = 8.30 | χ2 = NOT FOUND |
Rwp = 11.4 | 5001 data points |
Rexp = 9.25 | 1 parameters |
RBragg = 4.79 | 0 restraints |
Special details top
Experimental. Samples were prepared by solid state reaction of appropriate amounts of Gd2O3 and CeO2 at 1573 K followed by 1673 K for 48 hrs. Heating and cooling rates are 2 degrees per min. Details are given in manuscript |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top | x | y | z | Uiso*/Ueq | Occ. (<1) |
Gd1 | 0.25000 | 0.25000 | 0.25000 | 0.02984* | 0.6 |
Ce1 | 0.25000 | 0.25000 | 0.25000 | 0.02984* | 0.4 |
Gd2 | −0.0188 (2) | 0.00000 | 0.25000 | 0.01591* | 0.6 |
Ce2 | −0.0188 (2) | 0.00000 | 0.25000 | 0.01591* | 0.4 |
O1 | 0.3880 (17) | 0.1391 (16) | 0.376 (3) | 0.01635* | 0.95 (4) |
O2 | 0.402 (2) | 0.402 (2) | 0.402 (2) | 0.01635* | 0.56 (4) |
(II) Gadolinium Cerium oxide
top
Crystal data top
Gd0.8Ce0.2O1.60 | Dx = 7.46 Mg m−3 |
Mr = 179.40 | X-ray radiation, λ = 1.540600 Å |
Cubic, IA3 | T = 293 K |
Hall symbol: -I 2b 2c 3 | White |
a = 10.8488 (1) Å | flat sheet, ? × ? × ? mm |
V = 1276.86 (2) Å3 | Specimen preparation: Prepared at 1673K K, cooled at 2K/min K min−1 |
Z = 32 | |
Data collection top
Philips PW1710 diffractometer | Data collection mode: reflection |
Radiation source: sealed X-ray tube | Scan method: Step |
Graphite 002 face monochromator | 2θmin = 10.000°, 2θmax = 110.000°, 2θstep = 0.020° |
Specimen mounting: Sample pasted with on glass slide with collodion binder' | |
Refinement top
Rp = 8.48 | Profile function: 'Pseudo-voigt function'
'U = 0.04722(448) , V = -0.04828(503), W = 0.02867(138)'
'Eta = 0.525(32), X = 0.0051(7)' |
Rwp = 11.5 | 23 parameters |
Rexp = 9.63 | 0 restraints |
RBragg = 5.85 | |
χ2 = NOT FOUND | Background function: 5th order polynomial function |
5001 data points | Preferred orientation correction: 'March function' axis (001), G1 = 1.0088(61), |
Crystal data top
Gd0.8Ce0.2O1.60 | Z = 32 |
Mr = 179.40 | X-ray radiation, λ = 1.540600 Å |
Cubic, IA3 | T = 293 K |
a = 10.8488 (1) Å | flat sheet, ? × ? × ? mm |
V = 1276.86 (2) Å3 | |
Data collection top
Philips PW1710 diffractometer | Scan method: Step |
Specimen mounting: Sample pasted with on glass slide with collodion binder' | 2θmin = 10.000°, 2θmax = 110.000°, 2θstep = 0.020° |
Data collection mode: reflection | |
Refinement top
Rp = 8.48 | χ2 = NOT FOUND |
Rwp = 11.5 | 5001 data points |
Rexp = 9.63 | 23 parameters |
RBragg = 5.85 | 0 restraints |
Special details top
Experimental. Samples were prepared by solid state reaction of appropriate amounts of Gd2O3 and CeO2 at 1573 K followed by 1673 K for 48 hrs. Heating and cooling rates are 2 degrees per min. Details are given in manuscript |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top | x | y | z | Uiso*/Ueq | Occ. (<1) |
Gd1 | 0.25000 | 0.25000 | 0.25000 | 0.00798* | 0.8 |
Gd1 | 0.25000 | 0.25000 | 0.25000 | 0.00798* | 0.2 |
Gd2 | −0.02515 (14) | 0.00000 | 0.25000 | 0.00391* | 0.8 |
Gd2 | −0.02515 (14) | 0.00000 | 0.25000 | 0.00391* | 0.2 |
O1 | 0.3911 (15) | 0.1470 (14) | 0.3763 (19) | 0.00636* | 0.96 (6) |
O2 | 0.407 (3) | 0.407 (3) | 0.407 (3) | 0.00636* | 0.37 (6) |
Experimental details
| (I) | (II) |
Crystal data |
Chemical formula | Gd0.6Ce0.4O1.70 | Gd0.8Ce0.2O1.60 |
Mr | 177.60 | 179.40 |
Crystal system, space group | Cubic, IA3 | Cubic, IA3 |
Temperature (K) | 293 | 293 |
a (Å) | 10.8542 (1) | 10.8488 (1) |
V (Å3) | 1278.76 (1) | 1276.86 (2) |
Z | 32 | 32 |
Radiation type | X-ray, λ = ? Å | X-ray, λ = 1.540600 Å |
Specimen shape, size (mm) | Flat sheet, ? × ? × ? | Flat sheet, ? × ? × ? |
|
Data collection |
Diffractometer | Philips PW1710 diffractometer | Philips PW1710 diffractometer |
Specimen mounting | Sample pasted with on glass slide with collodion binder | Sample pasted with on glass slide with collodion binder' |
Data collection mode | Reflection | Reflection |
Scan method | Step | Step |
2θ values (°) | 2θmin = 10.000 2θmax = 110.000 2θstep = 0.020 | 2θmin = 10.000 2θmax = 110.000 2θstep = 0.020 |
|
Refinement |
R factors and goodness of fit | Rp = 8.30, Rwp = 11.4, Rexp = 9.25, RBragg = 4.79, χ2 = NOT FOUND | Rp = 8.48, Rwp = 11.5, Rexp = 9.63, RBragg = 5.85, χ2 = NOT FOUND |
No. of data points | 5001 | 5001 |
No. of parameters | 1 | 23 |
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