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Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three-dimensional mapping of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an objective lens in the diffracted beam, giving a magnified projection image. So far, the method has been applied with a time resolution of milliseconds to hours. In this work, the feasibility of DFXM at the picosecond time scale using an X-ray free-electron laser source and a pump–probe scheme is considered. Thermomechanical strain-wave simulations are combined with geometrical optics and wavefront propagation optics to simulate DFXM images of phonon dynamics in a diamond single crystal. Using the specifications of the XCS instrument at the Linac Coherent Light Source as an example results in simulated DFXM images clearly showing the propagation of a strain wave.

Supporting information

avi

AVI file https://doi.org/10.1107/S1600576721012760/te5086sup1.avi
Simulated DFXM movie showing the strain wave in Fig. 4(b) traversing the field of view at the speed of sound in diamond (18 km/s)

avi

AVI file https://doi.org/10.1107/S1600576721012760/te5086sup2.avi
Simulated DFXM movie showing a phi-scan for the strain wave in Fig. 4(b)

avi

AVI file https://doi.org/10.1107/S1600576721012760/te5086sup3.avi
Simulated DFXM movie showing a chi-scan for the strain wave in Fig. 4(b)

txt

Text file https://doi.org/10.1107/S1600576721012760/te5086sup4.txt
Noise model


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