The (hkl) Dependence of Diffraction-Line Broadening Caused by Strain and Size for all Laue Groups in Rietveld Refinement

Popa, N.C.

doi:10.1107/S0021889897009795

The (hkl) Dependence of Diffraction-Line Broadening Caused by Strain and Size for all Laue Groups in Rietveld Refinement

Models are presented which are compatible with the Rietveld method for the anisotropic broadening of the diffracted peaks produced by crystallite size and microstrain. The models, derived from general crystallographic considerations, are different for different Laue groups.

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The (hkl) Dependence of Diffraction-Line Broadening Caused by Strain and Size for all Laue Groups in Rietveld Refinement

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