A measuring procedure for single-crystal diffraction using synchrotron radiation

The use of synchrotron radiation (SR) for single-crystal diffraction measurements requires special features of both the instrumentation and the measuring procedure. This paper describes a new algorithm for data collection developed for synchrotron radiation. It has been used successfully at the five-circle diffractometer at HASYLAB (DESY, Hamburg). The main features are: precise location of the reflection position, determination of the measuring parameters by pre-scanning, subsequent fine scanning, and real-time monitoring of several parameters of the beam conditions for data reduction. This allows fast and precise data collection.