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A rotating glass capillary cell with a gas handling system has been built to allow in situ studies by powder X-ray diffraction. The cell can be used to condense volatile compounds, or to follow solid-state chemical reactions under vacuum or at gas pressures up to around 7 × 105 Pa. Using the cell, cooled by a stream of helium gas, the solid phases of 1,2-dichlorotrifluoroethane (HCFC-123a) and 2-chloro-1,1,1,2-tetrafluoroethane (HCFC-124) have been investigated using powder synchrotron X-ray radiation. These were found to have disordered hexagonal structures, with a = 4.018 (5), c = 6.553 (1) Å and a = 4.048 (1), c = 6.625 (1) Å, respectively, at 64 K.
Supporting information
Crystallographic Information File (CIF) https://doi.org/10.1107/S0909049503007969/kv2001sup1.cif | |
Rietveld powder data file (CIF format) https://doi.org/10.1107/S0909049503007969/kv2001Isup2.rtv | |
Structure factor file (CIF format) https://doi.org/10.1107/S0909049503007969/kv2001Isup3.hkl |
CCDC reference: 209201
Computing details top
(I) top
Crystal data top
C2HCl2F3 | Z = ? |
Mr = 152.93 | Melting point: 78 K |
Hexagonal, P63/mmc | Synchrotron radiation, λ = 0.401340 Å |
a = 4.000 Å | T = 60 K |
c = 6.523 Å | × × mm |
V = 90.37 Å3 |
Crystal data top
C2HCl2F3 | V = 90.37 Å3 |
Mr = 152.93 | Z = ? |
Hexagonal, P63/mmc | Synchrotron radiation, λ = 0.401340 Å |
a = 4.000 Å | T = 60 K |
c = 6.523 Å | × × mm |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
x | y | z | Biso*/Beq | ||
C | −0.14036 | 0.39482 | 0.04282 | 3.00* | |
C | 0.29145 | 0.69269 | 0.04592 | 3.00* | |
Cl | −0.34393 | 0.41134 | −0.19441 | 3.00* | |
Cl | 0.49659 | 0.68285 | 0.28375 | 3.00* | |
F | −0.31455 | 0.47429 | 0.19040 | 3.00* | |
F | −0.19820 | 0.04516 | 0.07190 | 3.00* | |
F | 0.46472 | 0.60928 | −0.10377 | 3.00* | |
H | 0.33420 | 0.97862 | 0.02355 | 6.00* |
Experimental details
Crystal data | |
Chemical formula | C2HCl2F3 |
Mr | 152.93 |
Crystal system, space group | Hexagonal, P63/mmc |
Temperature (K) | 60 |
a, c (Å) | 4.000, 6.523 |
V (Å3) | 90.37 |
Z | ? |
Radiation type | Synchrotron, λ = 0.401340 Å |
µ (mm−1) | ? |
Crystal size (mm) | × × |
Data collection | |
Diffractometer | ? |
Absorption correction | ? |
No. of measured, independent and observed (?) reflections | ?, ?, ? |
Rint | ? |
Refinement | |
R[F2 > 2σ(F2)], wR(F2), S | ?, ?, 2.90 |
No. of reflections | ? |
No. of parameters | ? |
No. of restraints | ? |
Δρmax, Δρmin (e Å−3) | ?, ? |