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Figure 6
An IP diffraction image from a sputter-deposited α-Fe2O3 thin film analysed by SHIN-MAC ONE: (a) original (40 × 20 mm); (b) magnified; (c) cross section.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 3| May 1998| Pages 854-856
https://doi.org/10.1107/S0909049598000636
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